This course has been developed to give attendees the background to perform Microsystem reliability characterization from the component to system levels. Initially, we present the fundamentals of mechanical, environmental, and reliability testing as applied to Microsystems. The focus begins with the characterization of single components and structures; these are illustrated with practical examples from industry. We apply these procedures to MEMS and Microsystem level reliability test applications. Test techniques, specifications, and methodology are presented in detail with examples from industry. Additionally, for courses taking place in Neuchatel, participants will see live demonstrations of typical testing techniques to enable them to apply these concepts to their own application area.
This course is designed for the practicing scientist or engineer to provide a foundation in surface mechanical properties characterisation and reliability testing of Microsystems and Micro-Electro Mechanical Systems (MEMS).
Dr Nicholas X. Randall from CSM Instruments, Boston, USA.
Nicholas Randall: 1994 Bachelor of Science in Materials Technology from Brunel University (London, GB). 1997 PhD Thesis 'Development & Application of a Multifunctional Nanotribological Tool' from University of Neuchâtel (Neuchatel, CH). This project concluded in the commercial development of a testing instrument for characterising thin film mechanical properties and MEMS. 1996 - 2002 Customer Services Manager at CSM Instruments, Neuchâtel, responsible for Applications Laboratory, After-sales service, scientific literature and final testing of production instruments. 2002 Vice-President Business Development: Responsible for setting-up CSM Instruments subsidiary office in Boston USA. Active in continuing development of MEMS testing issues and applications.