The goal of this course is to introduce the participants to electron microscopy (EM) which allows the characterization of materials at the nanoscale. The course emphasizes the recent development of new techniques in electron microscopy. The topics covered include
SEM related techniques and applications:
TEM related techniques:
The topics will be illustrated by practical examples. The course will treat and answer the following questions:
- how these instruments and techniques work
- on which physical principles they are based
- in which field of micro and nanotechnology they are used
- how their results could be interpreted for explaining a phenomenon
R&D people in the field of microtechnology, material sciences and electronics.
Scanning Electron Microscope (SEM) and Environmental SEM (ESEM):
Focused Ion Beam (FIB): principle and application
Energy Dispersive X-Ray Spectrometer (EDS), limitations and resolution
Transmission Electron Microscope (TEM):
Visit of microscopy laboratories
Dr M.M. Dadras, is currently head of Microscopy and nanoscopy facilities at CSEM SA, Neuchâtel, Switzerland. M.M Dadras received his his Ph.D. at the University of Orsay, France in 1990. He has over 20 years experiences in Material Science and Electron Microscopy working initially at Institute of Structural Metallurgy of the University of Neuchâtel, Swissmetal, Institute of Microtechnology (IMT) at the University of Neuchâtel. In April 2008, after restructuring of IMT and transfer of microscopy section to CSEM, he became head of Microscopy and nanoscopy facilities in CSEM. His research activities are focused on microstructural studies and the relation of microstructure to the properties. Presently, his research activities are oriented towards the microstructural study and the improvement of properties of thin layers used in microfabricated sensors, actuators and microsystems.
Dr Sousan Abolhassani, Responsible for the Electron Microscopy at Paul Scherrer Institute, Switzerland. Sousan Abolhassani received her B.Sc. Degree from University of Surry in UK .Sc. In Materials Science and Technology in 1979. She continued her studies at the National Institute of Nuclear Science and Technology (I.N.S.T.N.) where she obtained her D.E.A (Diplôme d’Étude Approfondies) in 1987. She received her Ph.D. in Material Science and Solid State Chemistry. 1991 from Laboratoire de Chimie Appliquée de l'Etat Solide, École Nationale Supérieure de Chimie de Paris, and Université d’Orsay, France. She then started research in electron microscopy with the specialisation in Electron Energy Loss Spectroscopy at the University of Lausanne, in collaboration with the Centre of Electron Microscopy. In 1998, she changed to Paul Scherrer Institute where she is Responsible for the Electron Microscopy. She has a long teaching experience in the field of Electron microscopy (University of Lausanne), TEM and HRTEM image simulation and EELS and its application in microtechnology (University of Neuchâtel).